Scanning electron microscope optics and spectrometers / (Record no. 764761)

MARC details
000 -LEADER
fixed length control field 05520cam a2200613 a 4500
001 - CONTROL NUMBER
control field ocn738433338
003 - CONTROL NUMBER IDENTIFIER
control field OCoLC
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20241010143523.0
006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS
fixed length control field m d
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr cnu---unuuu
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 110705s2011 si a ob 001 0 eng d
040 ## - CATALOGING SOURCE
Original cataloging agency N$T
Language of cataloging eng
Description conventions pn
Transcribing agency N$T
Modifying agency EBLCP
-- E7B
-- YDXCP
-- I9W
-- OCLCQ
-- UIU
-- OCLCQ
-- DEBSZ
-- OCLCQ
-- OCLCF
-- LOA
-- JBG
-- AGLDB
-- MOR
-- PIFAG
-- ZCU
-- MERUC
-- OCLCQ
-- U3W
-- OCL
-- STF
-- WRM
-- OCLCQ
-- VTS
-- NRAMU
-- ICG
-- INT
-- AU@
-- OCLCQ
-- DKC
-- OCLCQ
-- M8D
-- UKAHL
-- OCLCQ
-- LEAUB
-- OCLCQ
-- UKCRE
-- OCLCQ
-- OCLCO
-- OCLCQ
-- QGK
-- OCLCO
-- OCLCL
019 ## -
-- 961498366
-- 962610082
-- 966257331
-- 988450996
-- 991940318
-- 1037784327
-- 1038564145
-- 1045438701
-- 1086540690
-- 1153477617
-- 1259146924
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9789812836687
Qualifying information (electronic bk.)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9812836683
Qualifying information (electronic bk.)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Canceled/invalid ISBN 9789812836670
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Canceled/invalid ISBN 9812836675
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 1283143550
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781283143554
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9786613143556
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 6613143553
035 ## - SYSTEM CONTROL NUMBER
System control number 374791
-- (N$T)
035 ## - SYSTEM CONTROL NUMBER
System control number (OCoLC)738433338
Canceled/invalid control number (OCoLC)961498366
-- (OCoLC)962610082
-- (OCoLC)966257331
-- (OCoLC)988450996
-- (OCoLC)991940318
-- (OCoLC)1037784327
-- (OCoLC)1038564145
-- (OCoLC)1045438701
-- (OCoLC)1086540690
-- (OCoLC)1153477617
-- (OCoLC)1259146924
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number QH212.S3
Item number K49 2011eb
072 #7 - SUBJECT CATEGORY CODE
Subject category code TEC
Subject category code subdivision 040000
Source bisacsh
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 681.413
Edition number 22
049 ## - LOCAL HOLDINGS (OCLC)
Holding library MAIN
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Khursheed, Anjam.
9 (RLIN) 583492
245 10 - TITLE STATEMENT
Title Scanning electron microscope optics and spectrometers /
Statement of responsibility, etc. Anjam Khursheed.
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc. Singapore ;
-- London :
Name of publisher, distributor, etc. World Scientific,
Date of publication, distribution, etc. ©2011.
300 ## - PHYSICAL DESCRIPTION
Extent 1 online resource (xiii, 402 pages) :
Other physical details illustrations
336 ## - CONTENT TYPE
Content type term text
Content type code txt
Source rdacontent
337 ## - MEDIA TYPE
Media type term computer
Media type code c
Source rdamedia
338 ## - CARRIER TYPE
Carrier type term online resource
Carrier type code cr
Source rdacarrier
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc Includes bibliographical references (pages 385-398) and index.
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note 1. Conventional SEM design. 1.1. Introduction to the SEM. 1.2. Basic principles of electron optics. 1.3. The electron gun. 1.4. Lens aberrations and primary beam probe size. 1.5. Deflection systems. 1.6. Quadrupole stigmators. 1.7. SEM output signals. 1.8. The emission hemisphere and BSE collection. 1.9. The scattered electron energy distribution. 1.10. The SE collection efficiency. 1.11. Specimen charging. 1.12. Elastic BSE imaging. 1.13. Selected SEM image examples -- 2. Spectrometer design principles. 2.1. Figures of merit. 2.2. The SAM and the SEM. 2.3. The retarding field analyzer. 2.4. Deflection field analyzers -- 3. In-lens improvements. 3.1. Magnetic immersion lenses. 3.2. Magnetic semi-in-lens designs. 3.3. Electric retarding field lenses. 3.4. Mixed field in-lens designs. 3.5. Selected in-lens image examples -- 4. Sub-nanometer probe diameters. 4.1. Monochromators and immersion objective lenses. 4.2. Aberration correctors. 4.3. The helium ion microscope -- 5. Secondary electron spectrometers. 5.1. Early deflection analyzers. 5.2. Retarding field analyzers. 5.3. Surface fields and signal-to-noise characteristics. 5.4. Deflection/multi-channel analyzers -- 6. Full range deflector spectrometer designs. 6.1. First-order focusing toroidal analyzers. 6.2. A second-order focusing toroidal analyzer design. 6.3. A modified fountain analyzer design -- 7. Full range parallel energy spectrometer designs. 7.1. The time-of-flight spectrometer. 7.2. A Gaussian field magnetic sector. 7.3. A round magnetic beam separator -- 8. Spectroscopic SEM proposals.
520 ## - SUMMARY, ETC.
Summary, etc. This book contains proposals to redesign the scanning electron microscope so that it is more compatible with other charged particle beam instrumentation and analytical techniques commonly used in surface science research. It emphasizes the concepts underlying spectrometer designs in the scanning electron microscope, and spectrometers are discussed under one common framework so that their relative strengths and weaknesses can be more readily appreciated. This is done, for the most part, through simulations and derivations carried out by the author himself. The book is aimed at scientists, engineers and graduate students whose research area or study in some way involves the scanning electron microscope and/or charged particle spectrometers. It can be used both as an introduction to these subjects and as a guide to more advanced topics about scanning electron microscope redesign.
588 0# - SOURCE OF DESCRIPTION NOTE
Source of description note Print version record.
546 ## - LANGUAGE NOTE
Language note English.
590 ## - LOCAL NOTE (RLIN)
Local note Added to collection customer.56279.3
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Scanning electron microscopes
General subdivision Design and construction.
9 (RLIN) 583493
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Spectrometer
General subdivision Design and construction.
9 (RLIN) 583494
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element TECHNOLOGY & ENGINEERING
General subdivision Technical & Manufacturing Industries & Trades.
Source of heading or term bisacsh
9 (RLIN) 28094
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Spectrometer
General subdivision Design and construction
Source of heading or term fast
9 (RLIN) 583494
758 ## -
-- has work:
-- Scanning electron microscope optics and spectrometers (Text)
-- https://id.oclc.org/worldcat/entity/E39PCGjkPHQ33vc6GHJgGyfd6X
-- https://id.oclc.org/worldcat/ontology/hasWork
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Relationship information Print version:
Main entry heading Khursheed, Anjam.
Title Scanning electron microscope optics and spectrometers.
Place, publisher, and date of publication Singapore ; London : World Scientific, ©2011
International Standard Book Number 9789812836670
Record control number (OCoLC)651077547
856 40 - ELECTRONIC LOCATION AND ACCESS
Materials specified EBSCOhost
Uniform Resource Identifier <a href="https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=374791">https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=374791</a>
938 ## -
-- Askews and Holts Library Services
-- ASKH
-- AH25565163
938 ## -
-- ProQuest Ebook Central
-- EBLB
-- EBL731284
938 ## -
-- ebrary
-- EBRY
-- ebr10480049
938 ## -
-- EBSCOhost
-- EBSC
-- 374791
938 ## -
-- YBP Library Services
-- YANK
-- 6965026
994 ## -
-- 92
-- N$T
Holdings
Withdrawn status Lost status Damaged status Not for loan Collection code Home library Current library Date acquired Total Checkouts Date last seen Price effective from Koha item type
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