Electron microscopy and analysis / Peter J. Goodhew, John Humphreys, Richard Beanland.

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TextPublisher: Boca Raton : CRC Press, Taylor & Francis Group, 2017Edition: Third editionDescription: 1 online resource : illustrationsContent type:

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Item type	Current library	Collection	Call number	Status	Date due	Barcode	Item holds
eBook	e-Library	EBSCO Technology		Available

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Online resource; title from PDF title page (EBSCO, viewed May 18, 2018).

Master record variable field(s) change: 050, 072, 082, 650