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1.
Trace theory and VLSI design / Jan L.A. van de Snepscheut. by Series: Lecture notes in computer science ; 200.
Material type: Text Text; Format: available online remote; Literary form: Not fiction
Publication details: Berlin ; New York : Springer-Verlag, ©1985
Dissertation note: Ph. D. Eindhoven University of Technology
Online resources:
Availability: Items available for loan: e-Library (1).
2.
Progress in VLSI design and test : 16th International Symposium, VDAT 2012, Shibpur, India, July 1-4, 2012. Proceedings / Hafizur Rahaman, Sanatan Chattopadhyay, Santanu Chattopadhyay (eds.). by Series: Lecture notes in computer science ; 7373. | LNCS sublibrary. SL 1, Theoretical computer science and general issues.
Material type: Text Text; Format: available online remote; Literary form: Not fiction
Publication details: Berlin ; New York : Springer, ©2012
Other title:
  • VDAT 2012
Online resources:
Availability: Items available for loan: e-Library (1).
3.
Skew-tolerant circuit design [electronic resource] / David Harris. by
Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction
Publication details: San Francisco : Morgan Kaufmann Publishers, c2001
Online resources:
Availability: Items available for loan: e-Library (1).
4.
Mixed analog-digital VLSI devices and technology [electronic resource] / Yannis Tsividis. by
Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction
Publication details: River Edge, NJ : World Scientific, c2002
Online resources:
Availability: Items available for loan: e-Library (1).
5.
VLSI test principles and architectures : design for testability / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen. by Series: Morgan Kaufmann series in systems on silicon
Material type: Text Text; Format: available online remote; Literary form: Not fiction
Publisher: Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, [2006]Copyright date: ©2006
Online resources:
Availability: Items available for loan: e-Library (1).
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