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Introduction to bioMEMS / Albert Folch. by
Material type: Text; Format:
print
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Not fiction
Publication details: Boca Raton : CRC Press, c2013
Availability: Items available for loan: Library (1)Call number: 66x-2013.
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Optical, electronic materials and applications II [electronic resource] : selected, peer reviewed papers from the 2nd International Conference on Optical, Electronic Materials and Applications 2012 (OEMA2012), May 25-26, 2012, Chongqing, China / edited by Kexiang Wei and Yuhang Yang. by Series: Advanced materials research ; v. 529.
Material type: Text; Format:
available online
; Literary form:
Not fiction
Publication details: Stafa-Zurich, Switzerland ; Enfield, NH : Trans Tech Publications, c2012
Availability: Items available for loan: e-Library (1).
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MEMS, NANO, and Smart Systems [electronic resource] : selected, peer reviewed papers from the 7th International Conference on MEMS, NANO and Smart Systems (ICMENS) : November 4-6, 2011, Kuala Lumpur, Malaysia / edited by Li Yuan. by Series: Advanced materials research ; v. 403-408.
Material type: Text; Format:
available online
; Literary form:
Not fiction
Publication details: Durnten-Zurich, Switzerland ; Enfield, NH : Trans Tech Publications, c2012
Other title:
- 7th International Conference on MEMS, NANO, and Smart Systems
- ICMENS 2011
Availability: Items available for loan: e-Library (1).
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ISTFA 2008 [electronic resource] : conference proceedings of the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA / sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2008, ASM International. by
Material type: Text; Format:
available online
; Literary form:
Not fiction
Publication details: Materials Park, Ohio : ASM International, 2008
Other title:
- International Symposium for Testing and Failure Analysis 2008
- Proceedings of the 34th International Symposium for Testing and Failure Analysis
- 34th International Symposium for Testing and Failure Analysis
- Thirty-fourth International Symposium for Testing and Failure Analysis
Availability: Items available for loan: e-Library (1).
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