Nanoscale spectroscopy and its applications to semiconductor research / Y. Watanabe [and others].
Material type:
TextSeries: Lecture notes in physics ; 588.Publication details: Berlin ; Heidelberg : Springer, 2002.Description: 1 online resource (xv, 306 pages) : illustrationsContent type: - text
- computer
- online resource
- 9783540458500
- 3540458506
- 9783662143728
- 3662143720
- 9783662143711
- 3662143712
- Electron spectroscopy -- Congresses
- Electron microscopy -- Congresses
- Semiconductors -- Materials -- Congresses
- Nanostructured materials -- Congresses
- Spectroscopie électronique -- Congrès
- Microscopie électronique -- Congrès
- Semi-conducteurs -- Matériaux -- Congrès
- Nanomatériaux -- Congrès
- Electron microscopy
- Electron spectroscopy
- Nanostructured materials
- Semiconductors -- Materials
- 621.3815/2 21
- QC454.E4
| Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|---|
eBook
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e-Library | eBook LN Physics | Available |
Includes bibliographical references and index.
Print version record.
Spectroscopy Using an Electron Microscope -- Synchrotron Radiation Nanospectroscopy -- Scanning Probe Spectroscopy.
Fabrication technologies for nanostructured devices have be- en developed recently, and the electrical and optical pro- perties of such nanostructures are a subject of advanced re- search. This book describes the different approaches to spectroscopic microscopy, i.e., electron beam probe spec- troscopy, spectroscopic photoelectron microscopy, and scan- ning probe spectroscopy. It will be useful as a compact source of reference for the experienced researcher, taking into account at the same time the needs of postgraduate stu- dents and nonspecialist researchers by using a tutorial ap- proach throughout. Fabrication technologies for nano-structured devices have been developed recently, and the electrical and optical properties of such nonostructures are a subject of advanced research. This book describes the different approaches to spectroscopic microscopy, that is, Electron Beam Probe Spectroscopy, Spectroscopic Photoelectron Microscopy, and Scanning Probe Spectroscopy. It will be useful as a compact source of reference for the experienced researcher, taking at the same time into account the needs of post graduate students and nonspecialist researchers by using a tutorial approach throughout.
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