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Volume microscopy : multiscale imaging with photons, electrons, and ions / edited by Irene Wacker, Eric Hummel, Steffen Burgold, Rasmus Schröder.

Contributor(s): Material type: TextTextSeries: NeuromethodsPublisher: New York, NY : Humana Press, 2020Description: 1 online resource (xvii, 306 pages) : illustrations (some color)Content type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 9781071606919
  • 1071606913
Subject(s): Genre/Form: Additional physical formats: Print version:: Volume microscopy.DDC classification:
  • 502.8/25 23
LOC classification:
  • QH212.E4
Online resources: Summary: This volume discusses different approaches to workflows for large volume electron microscopy - from preparation of samples to their imaging in a variety of microscopes - in some cases also applying correlative techniques. The chapters in this book cover topics such as correlative super resolution and electron microscopy to detect molecules in their native cellular context; low-threshold access to serial section arrays; improving serial blockface SEM by focal charge compensation; FIBSEM analysis of interfaces between hard technical devices and soft neuronal tissue; and image processing for volume electron microscopy. In Neuromethods series style, chapters include the kind of detail and key advice from the specialists needed to get successful results in your laboratory.
Holdings
Item type Current library Collection Call number Status Date due Barcode Item holds
eBook eBook e-Library eBook Protocols Available
Total holds: 0

Includes index.

Online resource; title from PDF title page (SpringerLink, viewed July 30, 2020).

This volume discusses different approaches to workflows for large volume electron microscopy - from preparation of samples to their imaging in a variety of microscopes - in some cases also applying correlative techniques. The chapters in this book cover topics such as correlative super resolution and electron microscopy to detect molecules in their native cellular context; low-threshold access to serial section arrays; improving serial blockface SEM by focal charge compensation; FIBSEM analysis of interfaces between hard technical devices and soft neuronal tissue; and image processing for volume electron microscopy. In Neuromethods series style, chapters include the kind of detail and key advice from the specialists needed to get successful results in your laboratory.

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