Structural, syntactic, and statistical pattern recognition : joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29-December 2, 2016, Proceedings / Antonio Robles-Kelly, Marco Loog, Battista Biggio, Francisco Escolano, Richard Wilson (eds.).
Material type:
TextSeries: Lecture notes in computer science ; 10029. | LNCS sublibrary. SL 6, Image processing, computer vision, pattern recognition, and graphics.Publisher: Cham, Switzerland : Springer, 2016Description: 1 online resource (xiii, 588 pages) : illustrationsContent type: - text
- computer
- online resource
- 9783319490557
- 3319490559
- 3319490540
- 9783319490540
- S+SSPR 2016
- Pattern recognition systems -- Congresses
- Reconnaissance des formes (Informatique) -- Congrès
- Pattern recognition
- Information retrieval
- Databases
- Algorithms & data structures
- Data mining
- Artificial intelligence
- Computers -- Computer Vision & Pattern Recognition
- Computers -- Information Technology
- Computers -- Database Management -- General
- Computers -- Programming -- Algorithms
- Computers -- Database Management -- Data Mining
- Computers -- Intelligence (AI) & Semantics
- Pattern recognition systems
- 006.4 23
- TK7882.P3
| Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|---|
eBook
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e-Library | eBook LNCS | Available |
International conference proceedings.
Includes author index.
Online resource; title from PDF title page (SpringerLink, viewed November 15, 2016).
Dimensionality reduction -- Manifold learning and embedding methods.-Dissimilarity representations -- Graph-theoretic methods -- Model selection, classification and clustering -- Semi and fully supervised learning methods -- Shape analysis -- Spatio-temporal pattern recognition -- Structural matching -- Text and document analysis.
This book constitutes the proceedings of the Joint IAPR International Workshop on Structural Syntactic, and Statistical Pattern Recognition, S+SSPR 2016, consisting of the International Workshop on Structural and Syntactic Pattern Recognition SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The 51 full papers presented were carefully reviewed and selected from 68 submissions. They are organized in the following topical sections: dimensionality reduction, manifold learning and embedding methods; dissimilarity representations; graph-theoretic methods; model selection, classification and clustering; semi and fully supervised learning methods; shape analysis; spatio-temporal pattern recognition; structural matching; text and document analysis.